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Electron Microscopy: Principles and Fundamentals [Repost]
![Electron Microscopy: Principles and Fundamentals [Repost]](https://pixhost.icu/avaxhome/15/2f/002c2f15.jpeg)
S. Amelinckx, Dirk van Dyck, J. van Landuyt, Gustaaf van Tendeloo - Electron Microscopy: Principles and Fundamentals
Published: 1997-11-04 | ISBN: 3527294791 | PDF | 527 pages | 63 MB
Electron Microscopy Principles and Fundamentals Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include:
Stationary Beam Methods: Transmission Electron Microscoy/Electron Energy Loss Spectroscopy/Convergent Electron Beam Diffraction/Low Energy Electron Microscopy/Electron Holographic Methods
Scanning Beam Methods: Scanning Transmission Electron Microscopy/Scanning Auger and XPS Microscopy/Scanning Microanalysis/Imaging Secondary Ion Mass Spectrometry
Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/Spin Polarized Low Energy Electron Microscopy
Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.