![Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications (2nd edition) [Repost]](https://pixhost.icu/avaxhome/46/bc/004cbc46_medium.jpg)
Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications (2nd edition) [Repost]
![Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications (2nd edition) [Repost]](https://pixhost.icu/avaxhome/46/bc/004cbc46.jpg)
Gernot Friedbacher, Henning Bubert - Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications (2nd edition)
Published: 2011-06-07 | ISBN: 3527320474 | PDF | 558 pages | 12.6 MB
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.