Statistical Performance Modeling and Optimization (Foundations and Trends(r) in Electronic Design Automation) by Xin Li
Statistical Performance Modeling and Optimization (Foundations and Trends(r) in Electronic Design Automation) by Xin Li
English | Aug. 8, 2007 | ISBN: 1601980566 | 162 Pages | PDF | 1 MB
English | Aug. 8, 2007 | ISBN: 1601980566 | 162 Pages | PDF | 1 MB
Statistical Performance Modeling and Optimization reviews various statistical methodologies that have been recently developed to model, analyze and optimize performance variations at both transistor level and system level in integrated circuit (IC) design. The following topics are discussed in detail: sources of process variations, variation characterization and modeling, Monte Carlo analysis, response surface modeling, statistical timing and leakage analysis, probability distribution extraction, parametric yield estimation and robust IC optimization. These techniques provide the necessary CAD infrastructure that facilitates the bold move from deterministic, corner-based IC design toward statistical and probabilistic design.