CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test by Andrei Pavlov, Manoj Sachdev
English | 2008 | ISBN: 1402083629 | 194 Pages | PDF | 8.0 MB
English | 2008 | ISBN: 1402083629 | 194 Pages | PDF | 8.0 MB
The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.