Soft Error Mechanisms, Modeling and Mitigation

Authors: Sayil, Selahattin
Introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced jitter and race, single event coupling noise, delay and speed-up effects and then compares coupling induced noise and delay effects to single event transients and soft delays
Presents closed form expressions for single event crosstalk noise, delay and speed-up effects
Includes a reliability analysis of low power energy-efficient designs so that reader can make clever design choices that reduce static power consumption and improve soft error reliability

This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel soft error mitigation techniques such as the Dynamic Threshold Technique and Soft Error Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE crosstalk noise, delay and speed-up effects. Various mitigation strategies to eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low power energy-efficient designs and the impact of leakage power consumption optimizations on soft error robustness. The author presents an analysis of various power optimization techniques, enabling readers to make design choices that reduce static power consumption and improve soft error reliability at the same time

Number of Illustrations and Tables
46 b/w illustrations, 35 illustrations in colour
Topics
Circuits and Systems
Electronic Circuits and Devices
Processor Architectures

Click Here to Buy the Hardcover from Springer



Click Here for More books