VLSI Design and Test: 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers by Anirban Sengupta
English | PDF | 2019 | 782 Pages | ISBN : 9813297662 | 110.22 MB
This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019.