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    https://sophisticatedspectra.com/article/drosia-serenity-a-modern-oasis-in-the-heart-of-larnaca.2521391.html

    DROSIA SERENITY
    A Premium Residential Project in the Heart of Drosia, Larnaca

    ONLY TWO FLATS REMAIN!

    Modern and impressive architectural design with high-quality finishes Spacious 2-bedroom apartments with two verandas and smart layouts Penthouse units with private rooftop gardens of up to 63 m² Private covered parking for each apartment Exceptionally quiet location just 5–8 minutes from the marina, Finikoudes Beach, Metropolis Mall, and city center Quick access to all major routes and the highway Boutique-style building with only 8 apartments High-spec technical features including A/C provisions, solar water heater, and photovoltaic system setup.
    Drosia Serenity is not only an architectural gem but also a highly attractive investment opportunity. Located in the desirable residential area of Drosia, Larnaca, this modern development offers 5–7% annual rental yield, making it an ideal choice for investors seeking stable and lucrative returns in Cyprus' dynamic real estate market. Feel free to check the location on Google Maps.
    Whether for living or investment, this is a rare opportunity in a strategic and desirable location.

    Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

    Posted By: roxul
    Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

    Osamu Ueda, "Materials and Reliability Handbook for Semiconductor Optical and Electron Devices"
    English | ISBN: 1461443369 | 2013 | 616 pages | EPUB, PDF | 11 MB + 22 MB

    Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature.
    The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.