Lock-in Thermography:
Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)
by Otwin Breitenstein
English | 2019 | ISBN: 3319998242 | 339 Pages | PDF | 13 MB
Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)
by Otwin Breitenstein
English | 2019 | ISBN: 3319998242 | 339 Pages | PDF | 13 MB
This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.