Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (repost)
Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials by Otwin Breitenstein, Wilhelm Warta and Martin Langenkamp
English | 2010 | ISBN: 3642024165, 3642264786 | 255 pages | PDF | 6,3 MB
English | 2010 | ISBN: 3642024165, 3642264786 | 255 pages | PDF | 6,3 MB
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography.
The book concentrates on applications to electronic devices and materials, but the basic chapters are useful as well for non-destructive evaluation. Various experimental approaches to LIT are reviewed with special emphasis to different available commercial LIT systems. New LIT applications are reviewed, like Illuminated LIT applied to solar cells , and non-thermal LIT lifetime mapping. Typical LIT investigation case studies are introduced.