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Efficient Test Methodologies for High-Speed Serial Links (Lecture Notes in Electrical Engineering)

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Efficient Test Methodologies for High-Speed Serial Links (Lecture Notes in Electrical Engineering)

Dongwoo Hong, Kwang-Ting (Tim) Cheng "Efficient Test Methodologies for High-Speed Serial Links (Lecture Notes in Electrical Engineering)"
Springer | English | 2009-12-10 | ISBN: 9048134420 | 98 pages | PDF | 1,9 MB


Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

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