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  3. Accelerated Life Testing of One-shot Devices: Data Collection and Analysis

Accelerated Life Testing of One-shot Devices: Data Collection and Analysis

Posted By: arundhati
Date: 23 Aug 2022 02:15:40
Accelerated Life Testing of One-shot Devices: Data Collection and Analysis

Narayanaswamy Balakrishnan, "Accelerated Life Testing of One-shot Devices: Data Collection and Analysis"
English | ISBN: 1119664004 | 2021 | 240 pages | PDF | 3 MB

Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing
Estimating the reliability of one-shot devices—electro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only once—poses unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests.
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