In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science (repost)
In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science by Gerhard Dehm, James M. Howe and Josef Zweck
English | ISBN: 3527319735 | 2012 | PDF | 386 pages | 5,5 MB
English | ISBN: 3527319735 | 2012 | PDF | 386 pages | 5,5 MB
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples.
The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.