Power-Constrained Testing of VLSI Circuits

Posted By: tot167
Power-Constrained Testing of VLSI Circuits

Nicola Nicolici, Bashir M. Al-Hashimi, "Power-Constrained Testing of VLSI Circuits"
Springer | 2003 | ISBN: 140207235X | 180 pages | PDF | 10 MB

Text focuses on the techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. Fore researchers and practitioners.

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